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| Автор: Daniel Chateigner |
| Издательство: John Wiley & Sons Limited |
| Cтраниц: 1 |
| Формат: PDF |
| Размер: 0 |
| ISBN: 9781118622711 |
| Качество: excellent |
| Язык: |
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Описание:
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This book introduces and details the key facets of Combined Analysis – an x-ray and/or neutron scattering methodology which combines structural, textural, stress, microstructural, phase, layer, or other relevant variable or property analyses in a single approach. The text starts with basic theories related to diffraction by polycrystals and some of the most common combined analysis instrumental set-ups are detailed. Also discussed are microstructures of powder diffraction profiles; quantitative phase analysis from the Rietveld analysis; residual stress analysis for isotropic and anisotropic materials; specular x-ray reflectivity, and the various associated models.
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