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| Автор: Leo Beiser |
| Издательство: John Wiley & Sons Limited |
| Cтраниц: 1 |
| Формат: PDF |
| Размер: 0 |
| ISBN: 9780471431411 |
| Качество: excellent |
| Язык: |
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Written by an award-winning leader in the field, this is a thoroughly integrated overview of the many facets and disciplines of optical scanning. Of particular utility to both practitioner and student are such features as: An overview of the technology and unifying principles, including active and passive scanning, optical transfer, and system architecture In-depth chapters on scanning theory and processes, scanned resolution, scanner devices and techniques, and the control of scanner beam misplacemen A comprehensive review of the government-sponsored research of agile beam steering, now primed for commercial adaptation A unique focus on the Lagrange invariant and its revealing resolution invariant
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